Analysis of a failure occurred during a test is crucial. Identifying the exact cause of the failure enables corrective measures to be taken, at the design level and during the manufacturing process. A partnership with the Center for Characterization and Microscopy of Materials gives us access to state-of-the-art technology equipment. Use of the equipment by our personnel allows us: » To have a good understanding of the searched root cause (s) » To detect other problems not related to the main analysis » Flexibility and reasonable costs Available analysis equipments: » Transmission Electron Microscope » Focused Ion Beam » Scanning Electron Microscope » Scanning Electron Microscope Auger » X-Ray Diffractometer